Digital systems testing and testable design /

Digital systems testing and testable design /

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Detalles Bibliográficos
Main Authors: 190964 Abramovici, Miron, Breuer, Melvin A, Friedman, Arthur D.
Formato:
Idioma:eng
Publicado: New York, NY : Wiley-IEEE Press/Wiley Interscience, 1990
Subjects:
Digital integrated circuits

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