Possibilities and limitations of focused laser technique application for SEE sensitivity parameters estimation
The paper analyzes the applicability of methods for estimating the parameters of the VLSI sensitivity by single radiation effects (SEE) using focused laser radiation of picosecond duration in order to expand their application for submicron VLSI. A comparison of ionization track structure from a heav...
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| Format: | Article |
| Language: | English |
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Joint Stock Company "Experimental Scientific and Production Association SPELS
2019-09-01
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| Series: | Безопасность информационных технологий |
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| Online Access: | https://bit.mephi.ru/index.php/bit/article/view/1217 |