Capturing ion trapping and detrapping dynamics in electrochromic thin films

Abstract Ion trapping has been found to be responsible for the performance degradation in electrochromic oxide thin films, and a detrapping procedure was proved to be effective to rejuvenate the degraded films. Despite of the studies on ion trapping and detrapping, its dynamics remain largely unknow...

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Bibliographic Details
Main Authors: Renfu Zhang, Qinqi Zhou, Siyuan Huang, Yiwen Zhang, Rui-Tao Wen
Format: Article
Language:English
Published: Nature Portfolio 2024-03-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-024-46500-8