Multi-Resolution and Noise-Resistant Surface Defect Detection Approach Using New Version of Local Binary Patterns
Visual quality inspection systems play an important role in many industrial applications. In this respect, surface defect detection is one of the problems that have received much attention by image processing scientists. Until now, different methods have been proposed based on texture analysis. An o...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Taylor & Francis Group
2017-07-01
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| Series: | Applied Artificial Intelligence |
| Online Access: | http://dx.doi.org/10.1080/08839514.2017.1378012 |