Effect of HF Concentration on the PS Structures Prepared by Photoelectrochemical Etching

Porous silicon was fabricated at p-n junction wafer byphotoelectrochemical (PEC) etching. Silicon wafer with various electrolytecontaining different HF concentrations was used to explain PS formation by thereaction at the Si/ electrolyte interface. An investigation of the dependence on HFconcentrati...

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Main Authors: Yasmeen Z. Dawood, Bassam G. Rasheed, Ali H. AL-Hamdani
Format: Article
Language:English
Published: Unviversity of Technology- Iraq 2010-05-01
Series:Engineering and Technology Journal
Subjects:
Online Access:https://etj.uotechnology.edu.iq/article_27652_e6483617be65ece9e9a7c37c62430ee6.pdf
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author Yasmeen Z. Dawood
Bassam G. Rasheed
Ali H. AL-Hamdani
author_facet Yasmeen Z. Dawood
Bassam G. Rasheed
Ali H. AL-Hamdani
author_sort Yasmeen Z. Dawood
collection DOAJ
description Porous silicon was fabricated at p-n junction wafer byphotoelectrochemical (PEC) etching. Silicon wafer with various electrolytecontaining different HF concentrations was used to explain PS formation by thereaction at the Si/ electrolyte interface. An investigation of the dependence on HFconcentration to formed PS layer was made. The surface morphology of PS layerwas study as a function of HF concentration. Pillar like structures are formed atlow HF concentration and pores structures are obtained a at higher HFconcentration (40%). The etching rate increases with increasing HF concentrationcausing faster silicon dissolution. Thus the total pillar volume would increase byincreasing the HF concentration.
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spelling doaj.art-0267d0ffa39e482bad6b122985e8545d2024-02-04T17:45:35ZengUnviversity of Technology- IraqEngineering and Technology Journal1681-69002412-07582010-05-0128112143215010.30684/etj.28.11.527652Effect of HF Concentration on the PS Structures Prepared by Photoelectrochemical EtchingYasmeen Z. DawoodBassam G. RasheedAli H. AL-HamdaniPorous silicon was fabricated at p-n junction wafer byphotoelectrochemical (PEC) etching. Silicon wafer with various electrolytecontaining different HF concentrations was used to explain PS formation by thereaction at the Si/ electrolyte interface. An investigation of the dependence on HFconcentration to formed PS layer was made. The surface morphology of PS layerwas study as a function of HF concentration. Pillar like structures are formed atlow HF concentration and pores structures are obtained a at higher HFconcentration (40%). The etching rate increases with increasing HF concentrationcausing faster silicon dissolution. Thus the total pillar volume would increase byincreasing the HF concentration.https://etj.uotechnology.edu.iq/article_27652_e6483617be65ece9e9a7c37c62430ee6.pdfporous siliconphoto electrochemical etchingetching ratehf concentration
spellingShingle Yasmeen Z. Dawood
Bassam G. Rasheed
Ali H. AL-Hamdani
Effect of HF Concentration on the PS Structures Prepared by Photoelectrochemical Etching
Engineering and Technology Journal
porous silicon
photo electrochemical etching
etching rate
hf concentration
title Effect of HF Concentration on the PS Structures Prepared by Photoelectrochemical Etching
title_full Effect of HF Concentration on the PS Structures Prepared by Photoelectrochemical Etching
title_fullStr Effect of HF Concentration on the PS Structures Prepared by Photoelectrochemical Etching
title_full_unstemmed Effect of HF Concentration on the PS Structures Prepared by Photoelectrochemical Etching
title_short Effect of HF Concentration on the PS Structures Prepared by Photoelectrochemical Etching
title_sort effect of hf concentration on the ps structures prepared by photoelectrochemical etching
topic porous silicon
photo electrochemical etching
etching rate
hf concentration
url https://etj.uotechnology.edu.iq/article_27652_e6483617be65ece9e9a7c37c62430ee6.pdf
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