Flicker Noise (1/<italic>f</italic>) in 45-nm PDSOI N-Channel FETs at Cryogenic Temperatures for Quantum Computing Applications

Flicker Noise (1/<italic>f</italic>) in 45-nm PDSOI N-Channel FETs at Cryogenic Temperatures for Quantum Computing Applications

In this paper, we have investigated the flicker noise (1/<inline-formula> <tex-math notation="LaTeX">$f$ </tex-math></inline-formula>) in 45-nm RFSOI NFETs for quantum computing applications. 1/<inline-formula> <tex-math notation="LaTeX">$f$ &l...

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Bibliographic Details
Main Authors: Shruti Pathak, Sumreti Gupta, P. Srinivasan, Oscar H. Gonzalez, Fernando Guarin, Abhisek Dixit
Format: Article
Language:English
Published: IEEE 2024-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Cryogenic temperature
frequency exponent
flicker noise
interface traps
noise model
PDSOI
Online Access:https://ieeexplore.ieee.org/document/10433783/

Internet

https://ieeexplore.ieee.org/document/10433783/

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