Ultrafast Single-Particle Imaging with Intense X-Ray Pulses

Ultrafast Single-Particle Imaging with Intense X-Ray Pulses

Ultrafast single-particle imaging with intense x-ray pulses from free-electron laser sources provides a new approach for visualizing structure and dynamics on the nanoscale. After a short introduction to the novel free-electron laser sources and methods, we highlight selected applications and discu...

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Bibliographic Details
Main Authors: Zhibin Sun, Andre Al Haddad, Sven Augustin, Gregor Knopp, Jonas Knurr, Kirsten Schnorr, Christoph Bostedt
Format: Article
Language:deu
Published: Swiss Chemical Society 2022-06-01
Series:CHIMIA
Subjects:
Ultrafast imaging
Free-electron laser
X-ray
Online Access:https://chimia.ch/chimia/article/view/6064

Internet

https://chimia.ch/chimia/article/view/6064

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