VHDL Modelling of Low-Cost Memory Fault Detection Tester
Memory modules are widely used in varies kind of electronics system design. Thecapacity of the memory moduleshas increased rapidly since the past few years in order to satisfy the high demand from the end-users.The memory modules’ manufacturersdemand more units of automatic test equi...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MMU Press
2020-12-01
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| Series: | Journal of Engineering Technology and Applied Physics |
| Subjects: | |
| Online Access: | https://journals.mmupress.com/index.php/jetap/article/view/99/286 |