Studies of Bis-(Sodium-Sulfopropyl)-Disulfide and 3-Mercapto-1-Propanesulfonate on/into the Copper Electrodeposited Layer by Time-of-Flight Secondary-Ion Mass Spectrometry

Studies of Bis-(Sodium-Sulfopropyl)-Disulfide and 3-Mercapto-1-Propanesulfonate on/into the Copper Electrodeposited Layer by Time-of-Flight Secondary-Ion Mass Spectrometry

Interactions of functional additives SPS (bis-(sodium-sulfopropyl)-disulfide), MPS (3-Mercapto-1-Propanesulfonate), and Cl accumulated and incorporated on/into a copper electrodeposited layer were studied using time-of-flight secondary-ion mass spectrometry (TOF-SIMS) in combination with cyclic volt...

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Bibliographic Details
Main Authors: Robert Mroczka, Agnieszka Słodkowska, Agata Ładniak
Format: Article
Language:English
Published: MDPI AG 2022-11-01
Series:Molecules
Subjects:
copper electrodeposition
SPS (bis-(sodium-sulfopropyl)-disulfide)
MPS (3-mercapto-1-propanesulfonate)
TOF-SIMS
cyclic voltammetry
Online Access:https://www.mdpi.com/1420-3049/27/23/8116

Internet

https://www.mdpi.com/1420-3049/27/23/8116

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