Low-Sparsity Unobservable Attacks Against Smart Grid: Attack Exposure Analysis and a Data-Driven Attack Scheme

Meter data collection and management in smart grid has the potential for underlying security risks, e.g., low-sparsity unobservable attacks. Thus, it is crucial to investigate the vulnerability of smart grid through various exposure tests associated with these unobservable attacks. Recently, much at...

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Bibliographic Details
Main Authors: Shengli Xie, Junjie Yang, Kan Xie, Yi Liu, Zhaoshui He
Format: Article
Language:English
Published: IEEE 2017-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/7885051/