Nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patterns
In this work we present an optical method for the direct determination of the piezoelectric coefficient of polymeric thin films. This is achieved through the measurement of nanometric mechanical displacements generated in the film when it is excited by low frequency harmonic electrical signals (0.5...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Universidad de Buenos Aires
2019-06-01
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| Series: | Revista Elektrón |
| Subjects: | |
| Online Access: | http://elektron.fi.uba.ar/index.php/elektron/article/view/76 |