Nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patterns
In this work we present an optical method for the direct determination of the piezoelectric coefficient of polymeric thin films. This is achieved through the measurement of nanometric mechanical displacements generated in the film when it is excited by low frequency harmonic electrical signals (0.5...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
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Universidad de Buenos Aires
2019-06-01
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| Series: | Revista Elektrón |
| Subjects: | |
| Online Access: | http://elektron.fi.uba.ar/index.php/elektron/article/view/76 |
| _version_ | 1830404039512162304 |
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| author | Pablo Etchepareborda Francisco Veiras Arturo Bianchetti Alejandro Federico Martin German Gonzalez |
| author_facet | Pablo Etchepareborda Francisco Veiras Arturo Bianchetti Alejandro Federico Martin German Gonzalez |
| author_sort | Pablo Etchepareborda |
| collection | DOAJ |
| description | In this work we present an optical method for the direct determination of the piezoelectric coefficient of polymeric thin films. This is achieved through the measurement of nanometric mechanical displacements generated in the film when it is excited by low frequency harmonic electrical signals (0.5 Hz). The system is based on the temporal speckle pattern interferometry technique and the recovery of phase by using a bivariate empirical mode decomposition framework. The experimental scheme was used on a sample of vinylidene polyfluoride deposited on a glass substrate. The sample presents similar conditions to those found in the characterization of complex fluids by photoacoustic techniques. The measured value agrees with those obtained by other methods and with the value reported by the manufacturer. |
| first_indexed | 2024-12-20T17:19:01Z |
| format | Article |
| id | doaj.art-03d63171dffa4e69aa8c4ea52f6f0889 |
| institution | Directory Open Access Journal |
| issn | 2525-0159 |
| language | English |
| last_indexed | 2024-12-20T17:19:01Z |
| publishDate | 2019-06-01 |
| publisher | Universidad de Buenos Aires |
| record_format | Article |
| series | Revista Elektrón |
| spelling | doaj.art-03d63171dffa4e69aa8c4ea52f6f08892022-12-21T19:31:54ZengUniversidad de Buenos AiresRevista Elektrón2525-01592019-06-0131525734Nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patternsPablo Etchepareborda0Francisco Veiras1Arturo Bianchetti2Alejandro Federico3Martin German Gonzalez4INTI-Electrónica e Informática, Laboratorio de Técnicas Ópticas y Fotónicas (Latof). Av. General Paz 5445, B1650WAB San Martín, Buenos Aires, ArgentinaGLOMAE-FIUBAINTI-LatofINTI-LatofGLOMAE-FIUBA and CONICETIn this work we present an optical method for the direct determination of the piezoelectric coefficient of polymeric thin films. This is achieved through the measurement of nanometric mechanical displacements generated in the film when it is excited by low frequency harmonic electrical signals (0.5 Hz). The system is based on the temporal speckle pattern interferometry technique and the recovery of phase by using a bivariate empirical mode decomposition framework. The experimental scheme was used on a sample of vinylidene polyfluoride deposited on a glass substrate. The sample presents similar conditions to those found in the characterization of complex fluids by photoacoustic techniques. The measured value agrees with those obtained by other methods and with the value reported by the manufacturer.http://elektron.fi.uba.ar/index.php/elektron/article/view/76speckledescomposición de modos empíricos bivariadospolímero piezoeléctrico |
| spellingShingle | Pablo Etchepareborda Francisco Veiras Arturo Bianchetti Alejandro Federico Martin German Gonzalez Nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patterns Revista Elektrón speckle descomposición de modos empíricos bivariados polímero piezoeléctrico |
| title | Nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patterns |
| title_full | Nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patterns |
| title_fullStr | Nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patterns |
| title_full_unstemmed | Nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patterns |
| title_short | Nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patterns |
| title_sort | nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patterns |
| topic | speckle descomposición de modos empíricos bivariados polímero piezoeléctrico |
| url | http://elektron.fi.uba.ar/index.php/elektron/article/view/76 |
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