Corrections to “Design-Oriented All-Regime All-Region 7-Parameter Short-Channel MOSFET Model Based on Inversion Charge”

In the above article <xref ref-type="bibr" rid="ref1">[1]</xref>, <xref rid="deqn33-deqn36" ref-type="disp-formula">equations (33)</xref> and <xref rid="deqn33-deqn36" ref-type="disp-formula">(36)</xref>...

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Main Authors: Dayana A. Pino-Monroy, Patrick Scheer, Mohamed Khalil Bouchoucha, Carlos Galup-Montoro, Manuel J. Barragan, Philippe Cathelin, Jean-Michel Fournier, Andreia Cathelin, Sylvain Bourdel
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Access
Online Access:https://ieeexplore.ieee.org/document/10113793/
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author Dayana A. Pino-Monroy
Patrick Scheer
Mohamed Khalil Bouchoucha
Carlos Galup-Montoro
Manuel J. Barragan
Philippe Cathelin
Jean-Michel Fournier
Andreia Cathelin
Sylvain Bourdel
author_facet Dayana A. Pino-Monroy
Patrick Scheer
Mohamed Khalil Bouchoucha
Carlos Galup-Montoro
Manuel J. Barragan
Philippe Cathelin
Jean-Michel Fournier
Andreia Cathelin
Sylvain Bourdel
author_sort Dayana A. Pino-Monroy
collection DOAJ
description In the above article <xref ref-type="bibr" rid="ref1">[1]</xref>, <xref rid="deqn33-deqn36" ref-type="disp-formula">equations (33)</xref> and <xref rid="deqn33-deqn36" ref-type="disp-formula">(36)</xref> had a typing error. The correct equations are:
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spelling doaj.art-04270bb56ad948ce828d7b6d352445872023-05-01T23:01:18ZengIEEEIEEE Access2169-35362023-01-0111396503965010.1109/ACCESS.2023.326721810113793Corrections to &#x201C;Design-Oriented All-Regime All-Region 7-Parameter Short-Channel MOSFET Model Based on Inversion Charge&#x201D;Dayana A. Pino-Monroy0https://orcid.org/0000-0002-2347-8870Patrick Scheer1Mohamed Khalil Bouchoucha2https://orcid.org/0000-0001-6578-1803Carlos Galup-Montoro3https://orcid.org/0000-0003-4623-6425Manuel J. Barragan4https://orcid.org/0000-0003-0187-604XPhilippe Cathelin5https://orcid.org/0000-0001-5603-3352Jean-Michel Fournier6Andreia Cathelin7https://orcid.org/0000-0003-2745-4523Sylvain Bourdel8https://orcid.org/0000-0001-9930-9945STMicroelectronics, Crolles, FranceSTMicroelectronics, Crolles, FranceSTMicroelectronics, Crolles, FranceDepartment of Electrical and Electronics Engineering, Universidade Federal de Santa Catarina, Florian&#x00F3;polis, BrazilTIMA Laboratory, CNRS, Grenoble INP, Universit&#x00E9; Grenoble Alpes, Grenoble, FranceSTMicroelectronics, Crolles, FranceTIMA Laboratory, CNRS, Grenoble INP, Universit&#x00E9; Grenoble Alpes, Grenoble, FranceSTMicroelectronics, Crolles, FranceTIMA Laboratory, CNRS, Grenoble INP, Universit&#x00E9; Grenoble Alpes, Grenoble, FranceIn the above article <xref ref-type="bibr" rid="ref1">[1]</xref>, <xref rid="deqn33-deqn36" ref-type="disp-formula">equations (33)</xref> and <xref rid="deqn33-deqn36" ref-type="disp-formula">(36)</xref> had a typing error. The correct equations are:https://ieeexplore.ieee.org/document/10113793/
spellingShingle Dayana A. Pino-Monroy
Patrick Scheer
Mohamed Khalil Bouchoucha
Carlos Galup-Montoro
Manuel J. Barragan
Philippe Cathelin
Jean-Michel Fournier
Andreia Cathelin
Sylvain Bourdel
Corrections to &#x201C;Design-Oriented All-Regime All-Region 7-Parameter Short-Channel MOSFET Model Based on Inversion Charge&#x201D;
IEEE Access
title Corrections to &#x201C;Design-Oriented All-Regime All-Region 7-Parameter Short-Channel MOSFET Model Based on Inversion Charge&#x201D;
title_full Corrections to &#x201C;Design-Oriented All-Regime All-Region 7-Parameter Short-Channel MOSFET Model Based on Inversion Charge&#x201D;
title_fullStr Corrections to &#x201C;Design-Oriented All-Regime All-Region 7-Parameter Short-Channel MOSFET Model Based on Inversion Charge&#x201D;
title_full_unstemmed Corrections to &#x201C;Design-Oriented All-Regime All-Region 7-Parameter Short-Channel MOSFET Model Based on Inversion Charge&#x201D;
title_short Corrections to &#x201C;Design-Oriented All-Regime All-Region 7-Parameter Short-Channel MOSFET Model Based on Inversion Charge&#x201D;
title_sort corrections to x201c design oriented all regime all region 7 parameter short channel mosfet model based on inversion charge x201d
url https://ieeexplore.ieee.org/document/10113793/
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