An overview on the non-destructive in-depth surface analysis of corrosion-resistant films: A case study of W-xCr deposits in 12 M HCl solution

An overview on the non-destructive in-depth surface analysis of corrosion-resistant films: A case study of W-xCr deposits in 12 M HCl solution

Non-destructive in-depth analysis of the surface films formed on the sputter-deposited binary W-xCr (x = 25, 57, 91 at %) alloys in 12 M HCl solution open to air at 30 °C was investigated using an angle-resolved X-ray photoelectron spectroscopic (AR-XPS) technique to understand the synergistic corr...

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Bibliographic Details
Main Author: Jagadish Bhattarai
Format: Article
Language:English
Published: Department of Physics, Mahendra Morang Adarsh Multiple Campus, Tribhuvan University 2021-01-01
Series:Bibechana
Subjects:
Non-destructive
Angle-resolved XPS
In-depth analysis
Corrosion-resistant
W-based sputter deposits
Online Access:https://www.nepjol.info/index.php/BIBECHANA/article/view/29222

Internet

https://www.nepjol.info/index.php/BIBECHANA/article/view/29222

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