Correction of height-fluctuation-induced systematic errors in polymers by AFM-based nanomechanical measurements
AFM-based nanomechanical measurements are powerful tools for the characterization of polymer composites. However, a flat surface of the samples is usually required, which restricts the wide applications of nanomechanical measurements. In this work, the height-fluctuation induced systematic errors we...
| Egile Nagusiak: | , , , , |
|---|---|
| Formatua: | Artikulua |
| Hizkuntza: | English |
| Argitaratua: |
Elsevier
2021-01-01
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| Saila: | Polymer Testing |
| Gaiak: | |
| Sarrera elektronikoa: | http://www.sciencedirect.com/science/article/pii/S0142941820321486 |