Correction of height-fluctuation-induced systematic errors in polymers by AFM-based nanomechanical measurements

AFM-based nanomechanical measurements are powerful tools for the characterization of polymer composites. However, a flat surface of the samples is usually required, which restricts the wide applications of nanomechanical measurements. In this work, the height-fluctuation induced systematic errors we...

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Bibliografske podrobnosti
Main Authors: Lu Mao, So Fujinami, Wentao Liu, Hao Liu, Ken Nakajima
Format: Article
Jezik:English
Izdano: Elsevier 2021-01-01
Serija:Polymer Testing
Teme:
Online dostop:http://www.sciencedirect.com/science/article/pii/S0142941820321486