Comparative Study on the Electrical and Mechanical Characteristics of Ni-30wt%Co and Cu-2wt%Be Alloy for Development of Semiconductor Test Probe Pin
Ultra-precision testing is a very important procedure to secure the reliability of the products as well as for the technology development in the areas of semiconductor and display. Accordingly, companies manufacturing equipment for testing of semiconductor and display have been continuously executin...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Polish Academy of Sciences
2019-09-01
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| Series: | Archives of Metallurgy and Materials |
| Subjects: | |
| Online Access: | https://journals.pan.pl/Content/113005/PDF/AMM-2019-3-24-Park.pdf |