Comparative Study on the Electrical and Mechanical Characteristics of Ni-30wt%Co and Cu-2wt%Be Alloy for Development of Semiconductor Test Probe Pin
Ultra-precision testing is a very important procedure to secure the reliability of the products as well as for the technology development in the areas of semiconductor and display. Accordingly, companies manufacturing equipment for testing of semiconductor and display have been continuously executin...
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Format: | Article |
Language: | English |
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Polish Academy of Sciences
2019-09-01
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Series: | Archives of Metallurgy and Materials |
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Online Access: | https://journals.pan.pl/Content/113005/PDF/AMM-2019-3-24-Park.pdf |
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author | Jin-Young Park Young-Choon Kim Jae-Gyun Kim |
author_facet | Jin-Young Park Young-Choon Kim Jae-Gyun Kim |
author_sort | Jin-Young Park |
collection | DOAJ |
description | Ultra-precision testing is a very important procedure to secure the reliability of the products as well as for the technology development in the areas of semiconductor and display. Accordingly, companies manufacturing equipment for testing of semiconductor and display have been continuously executing researches for the improvement of the performances of test sockets used in test equipment. Through this study, characteristics of the materials in accordance with the mechanical and electrical properties of Ni-30wt%Co alloy and newly developed Cu-2wt%Be alloy were analyzed in order to select the probe pin material of the socket, which is a key component used in the semiconductor testing equipment. In addition, finite element interpretation was executed by using Ansys Workbench 14.0 to comparatively analyze the finite element interpretation results and experimental results. Experiment was executed for the mechanical properties including tensile strength, elasticity modulus, specific heat, thermal expansion coefficient and Contact Force, for electrical properties, experiment on surface resistance, specific resistance and electrical conductivity was executed to measure the properties. It was confirmed that the results of finite element interpretation and experiment displayed similar trend and it is deemed that the Contact Force value was superior for Be-Co alloy. Through this study, it was confirmed that the newly developed Be-Co alloy is more appropriate as probe pin material used as the core component of test socket used in the semiconductor testing equipment than the existing Ni-Co alloy. |
first_indexed | 2024-04-12T07:40:43Z |
format | Article |
id | doaj.art-04a30c7796664cf59fedee761bf483b4 |
institution | Directory Open Access Journal |
issn | 2300-1909 |
language | English |
last_indexed | 2024-04-12T07:40:43Z |
publishDate | 2019-09-01 |
publisher | Polish Academy of Sciences |
record_format | Article |
series | Archives of Metallurgy and Materials |
spelling | doaj.art-04a30c7796664cf59fedee761bf483b42022-12-22T03:41:50ZengPolish Academy of SciencesArchives of Metallurgy and Materials2300-19092019-09-01vol. 64No 3943947https://doi.org/10.24425/amm.2019.129477Comparative Study on the Electrical and Mechanical Characteristics of Ni-30wt%Co and Cu-2wt%Be Alloy for Development of Semiconductor Test Probe PinJin-Young ParkYoung-Choon KimJae-Gyun KimUltra-precision testing is a very important procedure to secure the reliability of the products as well as for the technology development in the areas of semiconductor and display. Accordingly, companies manufacturing equipment for testing of semiconductor and display have been continuously executing researches for the improvement of the performances of test sockets used in test equipment. Through this study, characteristics of the materials in accordance with the mechanical and electrical properties of Ni-30wt%Co alloy and newly developed Cu-2wt%Be alloy were analyzed in order to select the probe pin material of the socket, which is a key component used in the semiconductor testing equipment. In addition, finite element interpretation was executed by using Ansys Workbench 14.0 to comparatively analyze the finite element interpretation results and experimental results. Experiment was executed for the mechanical properties including tensile strength, elasticity modulus, specific heat, thermal expansion coefficient and Contact Force, for electrical properties, experiment on surface resistance, specific resistance and electrical conductivity was executed to measure the properties. It was confirmed that the results of finite element interpretation and experiment displayed similar trend and it is deemed that the Contact Force value was superior for Be-Co alloy. Through this study, it was confirmed that the newly developed Be-Co alloy is more appropriate as probe pin material used as the core component of test socket used in the semiconductor testing equipment than the existing Ni-Co alloy.https://journals.pan.pl/Content/113005/PDF/AMM-2019-3-24-Park.pdfprobe pinbe-cu alloyni-co alloytest socketmechanical propertieselectrical properties |
spellingShingle | Jin-Young Park Young-Choon Kim Jae-Gyun Kim Comparative Study on the Electrical and Mechanical Characteristics of Ni-30wt%Co and Cu-2wt%Be Alloy for Development of Semiconductor Test Probe Pin Archives of Metallurgy and Materials probe pin be-cu alloy ni-co alloy test socket mechanical properties electrical properties |
title | Comparative Study on the Electrical and Mechanical Characteristics of Ni-30wt%Co and Cu-2wt%Be Alloy for Development of Semiconductor Test Probe Pin |
title_full | Comparative Study on the Electrical and Mechanical Characteristics of Ni-30wt%Co and Cu-2wt%Be Alloy for Development of Semiconductor Test Probe Pin |
title_fullStr | Comparative Study on the Electrical and Mechanical Characteristics of Ni-30wt%Co and Cu-2wt%Be Alloy for Development of Semiconductor Test Probe Pin |
title_full_unstemmed | Comparative Study on the Electrical and Mechanical Characteristics of Ni-30wt%Co and Cu-2wt%Be Alloy for Development of Semiconductor Test Probe Pin |
title_short | Comparative Study on the Electrical and Mechanical Characteristics of Ni-30wt%Co and Cu-2wt%Be Alloy for Development of Semiconductor Test Probe Pin |
title_sort | comparative study on the electrical and mechanical characteristics of ni 30wt co and cu 2wt be alloy for development of semiconductor test probe pin |
topic | probe pin be-cu alloy ni-co alloy test socket mechanical properties electrical properties |
url | https://journals.pan.pl/Content/113005/PDF/AMM-2019-3-24-Park.pdf |
work_keys_str_mv | AT jinyoungpark comparativestudyontheelectricalandmechanicalcharacteristicsofni30wtcoandcu2wtbealloyfordevelopmentofsemiconductortestprobepin AT youngchoonkim comparativestudyontheelectricalandmechanicalcharacteristicsofni30wtcoandcu2wtbealloyfordevelopmentofsemiconductortestprobepin AT jaegyunkim comparativestudyontheelectricalandmechanicalcharacteristicsofni30wtcoandcu2wtbealloyfordevelopmentofsemiconductortestprobepin |