Efficient flexible characterization of quantum processors with nested error models
We present a simple and powerful technique for finding a good error model for a quantum processor. The technique iteratively tests a nested sequence of models against data obtained from the processor, and keeps track of the best-fit model and its wildcard error (a metric of the amount of unmodeled e...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2021-01-01
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| Series: | New Journal of Physics |
| Subjects: | |
| Online Access: | https://doi.org/10.1088/1367-2630/ac20b9 |