TAISAM: A Transistor Array-Based Test Method for Characterizing Heavy Ion-Induced Sensitive Areas in Semiconductor Materials

TAISAM: A Transistor Array-Based Test Method for Characterizing Heavy Ion-Induced Sensitive Areas in Semiconductor Materials

The heavy ion-induced sensitive area is an essential parameter for space application integrated circuits. Circuit Designers need it to evaluate and mitigate heavy ion-induced soft errors. However, it is hard to measure this parameter due to the lack of test structures and methods. In this paper, a t...

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Bibliographic Details
Main Authors: Jinjin Shao, Ruiqiang Song, Yaqing Chi, Bin Liang, Zhenyu Wu
Format: Article
Language:English
Published: MDPI AG 2022-06-01
Series:Electronics
Subjects:
radiation effect
radiation test method
heavy ion
sensitive area
parasitic bipolar amplification
Online Access:https://www.mdpi.com/2079-9292/11/13/2043

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https://www.mdpi.com/2079-9292/11/13/2043

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