High-quality single crystalline NiO with twin phases grown on sapphire substrate by metalorganic vapor phase epitaxy
High-quality single crystalline twin phase NiO grown on sapphire substrates by metalorganic vapor phase epitaxy is reported. X-ray rocking curve analysis of NiO films grown at different temperatures indicates a minimum full width at half maximum of the cubic (111) diffraction peak of 0.107° for NiO...
Main Authors: | , , , , |
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Format: | Article |
Language: | English |
Published: |
AIP Publishing LLC
2012-12-01
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Series: | AIP Advances |
Online Access: | http://dx.doi.org/10.1063/1.4769082 |