Structural and Optical Properties ofCdSxTe1-xThin Films Fabricated by Thermal Evaporation.
CdSxTe1-x films in the range of ( x=0.9 , 0.8, 0.7 ) about 300 nm thickness have been formed on glass substrates by thermal evaporation . X-ray results showed that the CdTe film was polycrystalline with cubic zinc blend structure and had preferred growth of grains along the (111) crystallographic di...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
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University of Anbar
2014-02-01
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| Series: | مجلة جامعة الانبار للعلوم الصرفة |
| Subjects: | |
| Online Access: | https://juaps.uoanbar.edu.iq/article_85002_3d534cf746b98881c7db6962293ed7cc.pdf |