Correction to “Stable Operation of AlGaN/GaN HEMTs for 25 Hours at 400°C in Air”

In the referenced paper <xref ref-type="bibr" rid="ref1">[1]</xref>, the micro-photograph shown in <xref rid="fig1" ref-type="fig">Fig. 1 (b)</xref> is of a representative HEMT. The measured HEMT of the paper has the following dimension...

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Bibliographic Details
Main Authors: Saleh Kargarrazi, Ananth Saran Yalamarthy, Peter F. Satterthwaite, Scott William Blankenberg, Caitlin Chapin, Debbie G. Senesky
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Journal of the Electron Devices Society
Online Access:https://ieeexplore.ieee.org/document/9146765/