Influence of Precession Electron Diffraction Parameters and Energy Filtering on Reduced Density Function Analysis of Thin Amorphous Silica Films—Implications for Structural Studies

Influence of Precession Electron Diffraction Parameters and Energy Filtering on Reduced Density Function Analysis of Thin Amorphous Silica Films—Implications for Structural Studies

We investigated the influence of precession angle, energy filtering and sample thickness on the structural parameters of amorphous SiO<sub>2</sub> thin films from the electron reduced density functions obtained by applying precession electron diffraction. The results demonstrate that the...

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Bibliographic Details
Main Authors: Yu-Jen Chou, Konstantin B. Borisenko, Partha Pratim Das, Stavros Nicolopoulos, Mauro Gemmi, Angus I. Kirkland
Format: Article
Language:English
Published: MDPI AG 2023-06-01
Series:Symmetry
Subjects:
transmission electron microscopy
precession electron diffraction
amorphous silica
reduced density function
pair distribution function
Online Access:https://www.mdpi.com/2073-8994/15/7/1291

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https://www.mdpi.com/2073-8994/15/7/1291

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