Influence of Precession Electron Diffraction Parameters and Energy Filtering on Reduced Density Function Analysis of Thin Amorphous Silica Films—Implications for Structural Studies
We investigated the influence of precession angle, energy filtering and sample thickness on the structural parameters of amorphous SiO<sub>2</sub> thin films from the electron reduced density functions obtained by applying precession electron diffraction. The results demonstrate that the...
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MDPI AG
2023-06-01
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| Series: | Symmetry |
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| Online Access: | https://www.mdpi.com/2073-8994/15/7/1291 |
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| author | Yu-Jen Chou Konstantin B. Borisenko Partha Pratim Das Stavros Nicolopoulos Mauro Gemmi Angus I. Kirkland |
| author_facet | Yu-Jen Chou Konstantin B. Borisenko Partha Pratim Das Stavros Nicolopoulos Mauro Gemmi Angus I. Kirkland |
| author_sort | Yu-Jen Chou |
| collection | DOAJ |
| description | We investigated the influence of precession angle, energy filtering and sample thickness on the structural parameters of amorphous SiO<sub>2</sub> thin films from the electron reduced density functions obtained by applying precession electron diffraction. The results demonstrate that the peak positions in the electron reduced density functions are generally insensitive to the studied experimental conditions, while both precession angle and energy filtering influence peak heights considerably. It is also shown that introducing precession with small angles of up to 2 degrees and energy filtering results in higher coordination numbers that are closer to the expected theoretical values of 4 and 2 for Si and O, respectively, for data obtained from a thicker sample. |
| first_indexed | 2024-03-11T00:36:47Z |
| format | Article |
| id | doaj.art-05ab58ca82254e79ab5f1c3b98a5d5be |
| institution | Directory Open Access Journal |
| issn | 2073-8994 |
| language | English |
| last_indexed | 2024-03-11T00:36:47Z |
| publishDate | 2023-06-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Symmetry |
| spelling | doaj.art-05ab58ca82254e79ab5f1c3b98a5d5be2023-11-18T21:33:03ZengMDPI AGSymmetry2073-89942023-06-01157129110.3390/sym15071291Influence of Precession Electron Diffraction Parameters and Energy Filtering on Reduced Density Function Analysis of Thin Amorphous Silica Films—Implications for Structural StudiesYu-Jen Chou0Konstantin B. Borisenko1Partha Pratim Das2Stavros Nicolopoulos3Mauro Gemmi4Angus I. Kirkland5Department of Mechanical Engineering, National Taiwan University of Science and Technology, No. 43, Sec. 4, Keelung Road, Taipei 10607, TaiwanThe Kennedy Institute of Rheumatology, University of Oxford, Oxford OX3 7FY, UKNanoMEGAS SPRL, Rue Èmile Claus 49 bte 9, 1050 Brussels, BelgiumNanoMEGAS SPRL, Rue Èmile Claus 49 bte 9, 1050 Brussels, BelgiumIstituto Italiano di Tecnologia, Center for Materials Interfaces, Electron Crystallography, Viale Rinaldo Piaggio 34, 56025 Pontedera, ItalyDepartment of Materials, University of Oxford, Oxford OX1 3PH, UKWe investigated the influence of precession angle, energy filtering and sample thickness on the structural parameters of amorphous SiO<sub>2</sub> thin films from the electron reduced density functions obtained by applying precession electron diffraction. The results demonstrate that the peak positions in the electron reduced density functions are generally insensitive to the studied experimental conditions, while both precession angle and energy filtering influence peak heights considerably. It is also shown that introducing precession with small angles of up to 2 degrees and energy filtering results in higher coordination numbers that are closer to the expected theoretical values of 4 and 2 for Si and O, respectively, for data obtained from a thicker sample.https://www.mdpi.com/2073-8994/15/7/1291transmission electron microscopyprecession electron diffractionamorphous silicareduced density functionpair distribution function |
| spellingShingle | Yu-Jen Chou Konstantin B. Borisenko Partha Pratim Das Stavros Nicolopoulos Mauro Gemmi Angus I. Kirkland Influence of Precession Electron Diffraction Parameters and Energy Filtering on Reduced Density Function Analysis of Thin Amorphous Silica Films—Implications for Structural Studies Symmetry transmission electron microscopy precession electron diffraction amorphous silica reduced density function pair distribution function |
| title | Influence of Precession Electron Diffraction Parameters and Energy Filtering on Reduced Density Function Analysis of Thin Amorphous Silica Films—Implications for Structural Studies |
| title_full | Influence of Precession Electron Diffraction Parameters and Energy Filtering on Reduced Density Function Analysis of Thin Amorphous Silica Films—Implications for Structural Studies |
| title_fullStr | Influence of Precession Electron Diffraction Parameters and Energy Filtering on Reduced Density Function Analysis of Thin Amorphous Silica Films—Implications for Structural Studies |
| title_full_unstemmed | Influence of Precession Electron Diffraction Parameters and Energy Filtering on Reduced Density Function Analysis of Thin Amorphous Silica Films—Implications for Structural Studies |
| title_short | Influence of Precession Electron Diffraction Parameters and Energy Filtering on Reduced Density Function Analysis of Thin Amorphous Silica Films—Implications for Structural Studies |
| title_sort | influence of precession electron diffraction parameters and energy filtering on reduced density function analysis of thin amorphous silica films implications for structural studies |
| topic | transmission electron microscopy precession electron diffraction amorphous silica reduced density function pair distribution function |
| url | https://www.mdpi.com/2073-8994/15/7/1291 |
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