Influence of Precession Electron Diffraction Parameters and Energy Filtering on Reduced Density Function Analysis of Thin Amorphous Silica Films—Implications for Structural Studies
We investigated the influence of precession angle, energy filtering and sample thickness on the structural parameters of amorphous SiO<sub>2</sub> thin films from the electron reduced density functions obtained by applying precession electron diffraction. The results demonstrate that the...
Main Authors: | Yu-Jen Chou, Konstantin B. Borisenko, Partha Pratim Das, Stavros Nicolopoulos, Mauro Gemmi, Angus I. Kirkland |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2023-06-01
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Series: | Symmetry |
Subjects: | |
Online Access: | https://www.mdpi.com/2073-8994/15/7/1291 |
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