How Nanoscale Dislocation Reactions Govern Low- Temperature and High-Stress Creep of Ni-Base Single Crystal Superalloys

The present work investigates γ-channel dislocation reactions, which govern low-temperature (T = 750 °C) and high-stress (resolved shear stress: 300 MPa) creep of Ni-base single crystal superalloys (SX). It is well known that two dislocation families with different b-vectors are re...

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Bibliographic Details
Main Authors: David Bürger, Antonin Dlouhý, Kyosuke Yoshimi, Gunther Eggeler
Format: Article
Language:English
Published: MDPI AG 2020-02-01
Series:Crystals
Subjects:
Online Access:https://www.mdpi.com/2073-4352/10/2/134