Design of Test Wrapper Scan Chain Based on Differential Evolution
Integrated Circuit has entered the era of design of the IP-based SoC (System on Chip), which makes the IP core reuse become a key issue. SoC test wrapper design for scan chain is a NP Hard problem, we propose an algorithm based on Differential Evolution (DE) to design wrapper scan chain. Through g...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Eastern Macedonia and Thrace Institute of Technology
2013-08-01
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| Series: | Journal of Engineering Science and Technology Review |
| Subjects: | |
| Online Access: | http://www.jestr.org/downloads/Volume6Issue2/fulltext36213.pdf |