Design of Test Wrapper Scan Chain Based on Differential Evolution
Integrated Circuit has entered the era of design of the IP-based SoC (System on Chip), which makes the IP core reuse become a key issue. SoC test wrapper design for scan chain is a NP Hard problem, we propose an algorithm based on Differential Evolution (DE) to design wrapper scan chain. Through g...
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Eastern Macedonia and Thrace Institute of Technology
2013-08-01
|
| Series: | Journal of Engineering Science and Technology Review |
| Subjects: | |
| Online Access: | http://www.jestr.org/downloads/Volume6Issue2/fulltext36213.pdf |
| Summary: | Integrated Circuit has entered the era of design of the IP-based SoC (System on Chip), which makes the IP core reuse
become a key issue. SoC test wrapper design for scan chain is a NP Hard problem, we propose an algorithm based on
Differential Evolution (DE) to design wrapper scan chain. Through group’s mutation, crossover and selection operations,
the design of test wrapper scan chain is achieved. Experimental verification is carried out according to the international
standard benchmark ITC’02. The results show that the algorithm can obtain shorter longest wrapper scan chains,
compared with other algorithms. |
|---|---|
| ISSN: | 1791-2377 1791-2377 |