Design of Test Wrapper Scan Chain Based on Differential Evolution
Integrated Circuit has entered the era of design of the IP-based SoC (System on Chip), which makes the IP core reuse become a key issue. SoC test wrapper design for scan chain is a NP Hard problem, we propose an algorithm based on Differential Evolution (DE) to design wrapper scan chain. Through g...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Eastern Macedonia and Thrace Institute of Technology
2013-08-01
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| Series: | Journal of Engineering Science and Technology Review |
| Subjects: | |
| Online Access: | http://www.jestr.org/downloads/Volume6Issue2/fulltext36213.pdf |
| _version_ | 1819173848759664640 |
|---|---|
| author | Aijun Zhu Zhi Li Wangchun Zhu Chuanpei Xu |
| author_facet | Aijun Zhu Zhi Li Wangchun Zhu Chuanpei Xu |
| author_sort | Aijun Zhu |
| collection | DOAJ |
| description | Integrated Circuit has entered the era of design of the IP-based SoC (System on Chip), which makes the IP core reuse
become a key issue. SoC test wrapper design for scan chain is a NP Hard problem, we propose an algorithm based on
Differential Evolution (DE) to design wrapper scan chain. Through group’s mutation, crossover and selection operations,
the design of test wrapper scan chain is achieved. Experimental verification is carried out according to the international
standard benchmark ITC’02. The results show that the algorithm can obtain shorter longest wrapper scan chains,
compared with other algorithms. |
| first_indexed | 2024-12-22T20:29:36Z |
| format | Article |
| id | doaj.art-06a59aee60414e3a8d4840b7aa7bbfa3 |
| institution | Directory Open Access Journal |
| issn | 1791-2377 1791-2377 |
| language | English |
| last_indexed | 2024-12-22T20:29:36Z |
| publishDate | 2013-08-01 |
| publisher | Eastern Macedonia and Thrace Institute of Technology |
| record_format | Article |
| series | Journal of Engineering Science and Technology Review |
| spelling | doaj.art-06a59aee60414e3a8d4840b7aa7bbfa32022-12-21T18:13:38ZengEastern Macedonia and Thrace Institute of TechnologyJournal of Engineering Science and Technology Review1791-23771791-23772013-08-01621014Design of Test Wrapper Scan Chain Based on Differential EvolutionAijun Zhu0Zhi Li1Wangchun Zhu2Chuanpei Xu3School of Mechano-Electronic Engineering，Xidian University，Xi'an 710071，China School of Mechano-Electronic Engineering，Xidian University，Xi'an 710071，China / School of Electronic Engineering and Automation，Guilin University of Electronic Technology，Guilin 541004，China / Guilin University of Aerospace Technology，Guilin 541004，China.School of Electronic Engineering and Automation，Guilin University of Electronic Technology，Guilin 541004，China School of Electronic Engineering and Automation，Guilin University of Electronic Technology，Guilin 541004，China Integrated Circuit has entered the era of design of the IP-based SoC (System on Chip), which makes the IP core reuse become a key issue. SoC test wrapper design for scan chain is a NP Hard problem, we propose an algorithm based on Differential Evolution (DE) to design wrapper scan chain. Through group’s mutation, crossover and selection operations, the design of test wrapper scan chain is achieved. Experimental verification is carried out according to the international standard benchmark ITC’02. The results show that the algorithm can obtain shorter longest wrapper scan chains, compared with other algorithms.http://www.jestr.org/downloads/Volume6Issue2/fulltext36213.pdfSoCDifferential EvolutionWrapper Scan Chain |
| spellingShingle | Aijun Zhu Zhi Li Wangchun Zhu Chuanpei Xu Design of Test Wrapper Scan Chain Based on Differential Evolution Journal of Engineering Science and Technology Review SoC Differential Evolution Wrapper Scan Chain |
| title | Design of Test Wrapper Scan Chain Based on Differential Evolution |
| title_full | Design of Test Wrapper Scan Chain Based on Differential Evolution |
| title_fullStr | Design of Test Wrapper Scan Chain Based on Differential Evolution |
| title_full_unstemmed | Design of Test Wrapper Scan Chain Based on Differential Evolution |
| title_short | Design of Test Wrapper Scan Chain Based on Differential Evolution |
| title_sort | design of test wrapper scan chain based on differential evolution |
| topic | SoC Differential Evolution Wrapper Scan Chain |
| url | http://www.jestr.org/downloads/Volume6Issue2/fulltext36213.pdf |
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