Nonlocal Effective Medium (NLEM) for Quantitative Modelling of Nanoroughness in Spectroscopic Reflectance

Nonlocal Effective Medium (NLEM) for Quantitative Modelling of Nanoroughness in Spectroscopic Reflectance

Spectroscopic reflectance is a versatile optical methodology for the characterization of transparent and semi-transparent thin films in terms of thickness and refractive index. The Fresnel equations are used to interpret the measurements, but their accuracy is limited when surface roughness is prese...

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Bibliographic Details
Main Authors: Eleftheria Lampadariou, Konstantinos Kaklamanis, Dimitrios Goustouridis, Ioannis Raptis, Elefterios Lidorikis
Format: Article
Language:English
Published: MDPI AG 2022-07-01
Series:Photonics
Subjects:
effective medium
Spectroscopic Reflectance
nanoroughness
Fresnel equations
Online Access:https://www.mdpi.com/2304-6732/9/7/499

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https://www.mdpi.com/2304-6732/9/7/499

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