Dissection of Superior Alleles for Yield-Related Traits and Their Distribution in Important Cultivars of Wheat by Association Mapping

Uncovering the genetic basis of yield-related traits is important for molecular improvement of wheat cultivars. In this study, a genome-wide association study was conducted using the wheat 55K genotyping assay and a diverse panel of 384 wheat genotypes. The accessions used included 18 founder parent...

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Bibliographic Details
Main Authors: Xiaojun Li, Xin Xu, Weihua Liu, Xiuquan Li, Xinming Yang, Zhengang Ru, Lihui Li
Format: Article
Language:English
Published: Frontiers Media S.A. 2020-03-01
Series:Frontiers in Plant Science
Subjects:
Online Access:https://www.frontiersin.org/article/10.3389/fpls.2020.00175/full