Damage Metrics for Void Detection in Adhesive Single-Lap Joints
Structural Health Monitoring (SHM) techniques, such as Electromechanical Impedance Spectroscopy (EMIS), aim to continuously monitor structures for defects, thus avoiding the need for regular maintenance. While attention has been given to the application of EMIS in the automatic detection of damage i...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2023-09-01
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| Series: | Mathematics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2227-7390/11/19/4127 |