Characterization of Volume Gratings Based on Distributed Dielectric Constant Model Using Mueller Matrix Ellipsometry
Volume grating is a key optical component due to its comprehensive applications. Other than the common grating structures, volume grating is essentially a predesigned refractive index distribution recorded in materials, which raises the challenges of metrology. Although we have demonstrated the pote...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2019-02-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/9/4/698 |