Optimization of Sputtering Process for Medium Entropy Alloy Nanotwinned CoCrFeNi Thin Films by Taguchi Method

We demonstrate a systematic study optimizing the properties of CoCrFeNi medium entropy alloy (MEA) thin films by tuning the deposition parameters of the pulsed direct current (DC) magnetron sputtering process. The chemical composition and microstructure of thin films were studied with energy dispers...

Full description

Bibliographic Details
Main Authors: Jing-Yi Zhong, Jian-Jie Wang, Fan-Yi Ouyang
Format: Article
Language:English
Published: MDPI AG 2022-11-01
Series:Materials
Subjects:
Online Access:https://www.mdpi.com/1996-1944/15/22/8238
_version_ 1797464665994821632
author Jing-Yi Zhong
Jian-Jie Wang
Fan-Yi Ouyang
author_facet Jing-Yi Zhong
Jian-Jie Wang
Fan-Yi Ouyang
author_sort Jing-Yi Zhong
collection DOAJ
description We demonstrate a systematic study optimizing the properties of CoCrFeNi medium entropy alloy (MEA) thin films by tuning the deposition parameters of the pulsed direct current (DC) magnetron sputtering process. The chemical composition and microstructure of thin films were studied with energy dispersive X-ray spectroscopy (EDS), an X-ray diffractometer (XRD) and a transmission electron microscope (TEM). Abundant nanotwins and the dual face-centered cubic−hexagonal close-packed (FCC-HCP) phases were formed in some specimens. The Taguchi experimental method and analysis of variance (ANOVA) were applied to find the optimized parameters. The control factors are five deposition parameters: substrate bias, substrate temperature, working pressure, rotation speed and pulsed frequency. According to the signal-to-noise ratio results, the optimized parameters for low electrical resistivity (98.2 ± 0.8 μΩ·cm), low surface roughness (0.5 ± 0.1 nm) and high hardness (9.3 ± 0.2 GPa) were achieved and verified with confirmed experiments.
first_indexed 2024-03-09T18:11:27Z
format Article
id doaj.art-071d705e7eb247d9bc48c8f4e79124dc
institution Directory Open Access Journal
issn 1996-1944
language English
last_indexed 2024-03-09T18:11:27Z
publishDate 2022-11-01
publisher MDPI AG
record_format Article
series Materials
spelling doaj.art-071d705e7eb247d9bc48c8f4e79124dc2023-11-24T09:06:24ZengMDPI AGMaterials1996-19442022-11-011522823810.3390/ma15228238Optimization of Sputtering Process for Medium Entropy Alloy Nanotwinned CoCrFeNi Thin Films by Taguchi MethodJing-Yi Zhong0Jian-Jie Wang1Fan-Yi Ouyang2Department of Engineering and System Science, National Tsing Hua University, Hsinchu 300044, TaiwanDepartment of Engineering and System Science, National Tsing Hua University, Hsinchu 300044, TaiwanDepartment of Engineering and System Science, National Tsing Hua University, Hsinchu 300044, TaiwanWe demonstrate a systematic study optimizing the properties of CoCrFeNi medium entropy alloy (MEA) thin films by tuning the deposition parameters of the pulsed direct current (DC) magnetron sputtering process. The chemical composition and microstructure of thin films were studied with energy dispersive X-ray spectroscopy (EDS), an X-ray diffractometer (XRD) and a transmission electron microscope (TEM). Abundant nanotwins and the dual face-centered cubic−hexagonal close-packed (FCC-HCP) phases were formed in some specimens. The Taguchi experimental method and analysis of variance (ANOVA) were applied to find the optimized parameters. The control factors are five deposition parameters: substrate bias, substrate temperature, working pressure, rotation speed and pulsed frequency. According to the signal-to-noise ratio results, the optimized parameters for low electrical resistivity (98.2 ± 0.8 μΩ·cm), low surface roughness (0.5 ± 0.1 nm) and high hardness (9.3 ± 0.2 GPa) were achieved and verified with confirmed experiments.https://www.mdpi.com/1996-1944/15/22/8238medium entropy alloysnanotwinned structuremagnetron sputteringTaguchi methodCoCrFeNi thin films
spellingShingle Jing-Yi Zhong
Jian-Jie Wang
Fan-Yi Ouyang
Optimization of Sputtering Process for Medium Entropy Alloy Nanotwinned CoCrFeNi Thin Films by Taguchi Method
Materials
medium entropy alloys
nanotwinned structure
magnetron sputtering
Taguchi method
CoCrFeNi thin films
title Optimization of Sputtering Process for Medium Entropy Alloy Nanotwinned CoCrFeNi Thin Films by Taguchi Method
title_full Optimization of Sputtering Process for Medium Entropy Alloy Nanotwinned CoCrFeNi Thin Films by Taguchi Method
title_fullStr Optimization of Sputtering Process for Medium Entropy Alloy Nanotwinned CoCrFeNi Thin Films by Taguchi Method
title_full_unstemmed Optimization of Sputtering Process for Medium Entropy Alloy Nanotwinned CoCrFeNi Thin Films by Taguchi Method
title_short Optimization of Sputtering Process for Medium Entropy Alloy Nanotwinned CoCrFeNi Thin Films by Taguchi Method
title_sort optimization of sputtering process for medium entropy alloy nanotwinned cocrfeni thin films by taguchi method
topic medium entropy alloys
nanotwinned structure
magnetron sputtering
Taguchi method
CoCrFeNi thin films
url https://www.mdpi.com/1996-1944/15/22/8238
work_keys_str_mv AT jingyizhong optimizationofsputteringprocessformediumentropyalloynanotwinnedcocrfenithinfilmsbytaguchimethod
AT jianjiewang optimizationofsputteringprocessformediumentropyalloynanotwinnedcocrfenithinfilmsbytaguchimethod
AT fanyiouyang optimizationofsputteringprocessformediumentropyalloynanotwinnedcocrfenithinfilmsbytaguchimethod