Design and Test of a Calibration System for Avalanche Photodiodes Used in X-Ray Compton Polarimeters for Space

Design and Test of a Calibration System for Avalanche Photodiodes Used in X-Ray Compton Polarimeters for Space

The development and calibration of a measurement system designed for assessing the performance of the avalanche photodiodes (APDs) used in the Compton scattering polarimeter of the CUSP project is discussed in this work. The designed system is able to characterize the APD gain <inline-formula>...

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Detaylı Bibliyografya
Asıl Yazarlar: Andrea Alimenti, Fabrizio Cologgi, Sergio Fabiani, Kostiantyn Torokhtii, Enrico Silva, Ettore Del Monte, Ilaria Baffo, Sergio Bonomo, Daniele Brienza, Riccardo Campana, Mauro Centrone, Giulia De Iulis, Enrico Costa, Giovanni Cucinella, Andrea Curatolo, Nicolas De Angelis, Giovanni De Cesare, Andrea Del Re, Sergio Di Cosimo, Simone Di Filippo, Alessandro Di Marco, Giuseppe Di Persio, Immacolata Donnarumma, Pierluigi Fanelli, Abhay Kumar, Paolo Leonetti, Alfredo Locarini, Pasqualino Loffredo, Giovanni Lombardi, Gabriele Minervini, Dario Modenini, Fabio Muleri, Silvia Natalucci, Andrea Negri, Massimo Perelli, Monia Rossi, Alda Rubini, Emanuele Scalise, Paolo Soffitta, Andrea Terracciano, Paolo Tortora, Emanuele Zaccagnino, Alessandro Zambardi
Materyal Türü: Makale
Dil:English
Baskı/Yayın Bilgisi: MDPI AG 2024-12-01
Seri Bilgileri:Sensors
Konular:
X-ray polarimeter
avalanche photodiode
measurement system for APD calibration
Online Erişim:https://www.mdpi.com/1424-8220/24/24/8016

Internet

https://www.mdpi.com/1424-8220/24/24/8016

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