Skip to content
VuFind
    • English
    • Deutsch
    • Español
    • Français
    • Italiano
    • 日本語
    • Nederlands
    • Português
    • Português (Brasil)
    • 中文(简体)
    • 中文(繁體)
    • Türkçe
    • עברית
    • Gaeilge
    • Cymraeg
    • Ελληνικά
    • Català
    • Euskara
    • Русский
    • Čeština
    • Suomi
    • Svenska
    • polski
    • Dansk
    • slovenščina
    • اللغة العربية
    • বাংলা
    • Galego
    • Tiếng Việt
    • Hrvatski
    • हिंदी
    • Հայերէն
    • Українська
    • Sámegiella
    • Монгол
Advanced
  • Investigating the potential va...
  • Cite this
  • Text this
  • Email this
  • Print
  • Export Record
    • Export to RefWorks
    • Export to EndNoteWeb
    • Export to EndNote
  • Permanent link
Investigating the potential variation of in-operando semiconductor nanostructures in electron beam direction

Investigating the potential variation of in-operando semiconductor nanostructures in electron beam direction

Bibliographic Details
Main Authors: Çelik Hüseyin, Fuchs Robert, Berger Dirk, Günther Christian M., Gaebel Simon, Wagner Tolga, Lehmann Michael
Format: Article
Language:English
Published: EDP Sciences 2024-01-01
Series:BIO Web of Conferences
Subjects:
electron-holography
semiconductor-nanostructures
3d-potential-distribution
surface-effects
computational-optimization
Online Access:https://www.bio-conferences.org/articles/bioconf/pdf/2024/48/bioconf_emc2024_04020.pdf
  • Holdings
  • Description
  • Similar Items
  • Staff View

Internet

https://www.bio-conferences.org/articles/bioconf/pdf/2024/48/bioconf_emc2024_04020.pdf

Similar Items

  • Approaching picosecond temporal resolution in off-axis electron holography
    by: Wagner Tolga, et al.
    Published: (2024-01-01)
  • Semiconductor nanostructures /
    by: Bimberg, Dieter
    Published: (2008)
  • Optical spectroscopy of semiconductor nanostructures /
    by: Ivchenko, Eougenious L., 1946-
    Published: (2005)
  • Optics of semiconductors and their nanostructures /
    by: Kalt, H. (Heinz), 1957-, et al.
    Published: (2004)
  • Handbook of instrumentation and techniques for semiconductor nanostructure characterization /
    by: Haight, Richard, et al.
    Published: (c201)

Search Options

  • Search History
  • Advanced Search

Find More

  • Browse the Catalog
  • Browse Alphabetically
  • Explore Channels
  • Course Reserves
  • New Items

Need Help?

  • Search Tips
  • Ask a Librarian
  • FAQs