Accurate Measurements of Wall Shear Stress on a Plate with Elliptic Leading Edge
A micro-floating element wall shear stress sensor with backside connections has been developed for accurate measurements of wall shear stress under the turbulent boundary layer. The micro-sensor was designed and fabricated on a 10.16 cm SOI (Silicon on Insulator) wafer by MEMS (Micro-Electro-Mechani...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2018-08-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | http://www.mdpi.com/1424-8220/18/8/2682 |