APA (7th ed.) Citation

Tholapi, R., Gallard, M., Burle, N., Guichet, C., Escoubas, S., Putero, M., . . . Thomas, O. (2020). Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling. MDPI AG.

Chicago Style (17th ed.) Citation

Tholapi, Rajkiran, et al. Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling. MDPI AG, 2020.

MLA (9th ed.) Citation

Tholapi, Rajkiran, et al. Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling. MDPI AG, 2020.