Optical Nano-Imaging of Materials: Peeping Through Tip-Enhanced Raman Scattering
High-resolution optical nano-imaging, with a spatial resolution far beyond the diffraction limits of the probing light, has been shown by means of tip-enhanced near-field Raman spectroscopy. The capabilities of imaging the physical and chemical properties of materials have been demonstrated...
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | deu |
| Published: |
Swiss Chemical Society
2006-11-01
|
| Series: | CHIMIA |
| Subjects: | |
| Online Access: | https://chimia.ch/chimia/article/view/4245 |