Comportamiento dieléctrico de cerámicos de CaCu<sub>3</sub>Ti<sub>4</sub>O<sub>12</sub>

In this work, CaCu<sub>3</sub>Ti<sub>4</sub>O<sub>12</sub> (CCTO) ceramics were prepared by solid state reaction at 900°C for 12 h and sintered at 1100°C during 3 h. The main phase detected through X-ray diffraction (XRD) was CCTO. Also, by means of Raman spectros...

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Bibliographic Details
Main Authors: Castro, M. S., Reboredo, M. M., Ramajo, L.
Format: Article
Language:English
Published: Elsevier 2011-08-01
Series:Boletín de la Sociedad Española de Cerámica y Vidrio
Subjects:
Online Access:http://ceramicayvidrio.revistas.csic.es/index.php/ceramicayvidrio/article/view/1077/1112