Effect of chemical abrasion of zircon on SIMS U–Pb, <i>δ</i><sup>18</sup>O, trace element, and LA-ICPMS trace element and Lu–Hf isotopic analyses
<p>This study assesses the effect of chemical abrasion on in situ mass spectrometric isotopic and elemental analyses in zircon. Chemical abrasion improves the U–Pb systematics of SIMS (secondary ion mass spectrometry) analyses of reference zircons, while leaving other isotopic systems largely...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Copernicus Publications
2024-07-01
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| Series: | Geochronology |
| Online Access: | https://gchron.copernicus.org/articles/6/337/2024/gchron-6-337-2024.pdf |