The Effect of Thermal Annealing on the Electrophysical Properties of Samples n-Si<Ni,Сu>
This paper presents the results of studies of the effect of isothermal annealing at temperatures T = 673¸1473 K in the time interval 5¸60 minutes on the electrical properties of silicon, simultaneously alloyed with nickel and copper. Samples of n-Si<Ni,Cu> were obtained on the basis of the sta...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
V.N. Karazin Kharkiv National University Publishing
2023-09-01
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| Series: | East European Journal of Physics |
| Subjects: | |
| Online Access: | https://periodicals.karazin.ua/eejp/article/view/22135 |