Experimental evidence of exciton capture by mid-gap defects in CVD grown monolayer MoSe2

Mid-gap defects: Carriers in a trap The temporal dynamics of photo-generated electrons and holes in MoSe2 trapped by defects are revealed. While transitional metal dichalcogenides have significant potential for optoelectronic applications, samples tend to contain defects such as vacancies and impuri...

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Main Authors: Ke Chen, Rudresh Ghosh, Xianghai Meng, Anupam Roy, Joon-Seok Kim, Feng He, Sarah C. Mason, Xiaochuan Xu, Jung-Fu Lin, Deji Akinwande, Sanjay K. Banerjee, Yaguo Wang
Format: Article
Language:English
Published: Nature Portfolio 2017-06-01
Series:npj 2D Materials and Applications
Online Access:https://doi.org/10.1038/s41699-017-0019-1
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author Ke Chen
Rudresh Ghosh
Xianghai Meng
Anupam Roy
Joon-Seok Kim
Feng He
Sarah C. Mason
Xiaochuan Xu
Jung-Fu Lin
Deji Akinwande
Sanjay K. Banerjee
Yaguo Wang
author_facet Ke Chen
Rudresh Ghosh
Xianghai Meng
Anupam Roy
Joon-Seok Kim
Feng He
Sarah C. Mason
Xiaochuan Xu
Jung-Fu Lin
Deji Akinwande
Sanjay K. Banerjee
Yaguo Wang
author_sort Ke Chen
collection DOAJ
description Mid-gap defects: Carriers in a trap The temporal dynamics of photo-generated electrons and holes in MoSe2 trapped by defects are revealed. While transitional metal dichalcogenides have significant potential for optoelectronic applications, samples tend to contain defects such as vacancies and impurities, most of which affect carrier mobility by inducing mid-gap states, i.e. within the bandgap. Now a team led by Yaguo Wang from the University of Texas elucidates the role of defects in samples grown by chemical vapor deposition. Femtosecond pump probe spectroscopy reveals that such defects are prone to capture (within few picoseconds) and then release (at slightly longer timescales of hundreds of picoseconds) electrons and holes. Such dynamics are intrinsic to samples grown with this particular method and possibly linked to the oxygen-associated impurities introduced during growth. This knowledge is relevant to engineering the properties of 2D materials for optoelectronics applications.
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spelling doaj.art-09adb0b97a6b4fd4939c1d7669bef8ec2022-12-21T19:25:31ZengNature Portfolionpj 2D Materials and Applications2397-71322017-06-01111810.1038/s41699-017-0019-1Experimental evidence of exciton capture by mid-gap defects in CVD grown monolayer MoSe2Ke Chen0Rudresh Ghosh1Xianghai Meng2Anupam Roy3Joon-Seok Kim4Feng He5Sarah C. Mason6Xiaochuan Xu7Jung-Fu Lin8Deji Akinwande9Sanjay K. Banerjee10Yaguo Wang11Department of Mechanical Engineering, The University of Texas at AustinMicroelectronics Research Center, The University of Texas at AustinDepartment of Mechanical Engineering, The University of Texas at AustinMicroelectronics Research Center, The University of Texas at AustinMicroelectronics Research Center, The University of Texas at AustinDepartment of Mechanical Engineering, The University of Texas at AustinDepartment of Mechanical Engineering, The University of Texas at AustinOmega Optics, Inc.Texas Materials Institute, The University of Texas at AustinMicroelectronics Research Center, The University of Texas at AustinMicroelectronics Research Center, The University of Texas at AustinDepartment of Mechanical Engineering, The University of Texas at AustinMid-gap defects: Carriers in a trap The temporal dynamics of photo-generated electrons and holes in MoSe2 trapped by defects are revealed. While transitional metal dichalcogenides have significant potential for optoelectronic applications, samples tend to contain defects such as vacancies and impurities, most of which affect carrier mobility by inducing mid-gap states, i.e. within the bandgap. Now a team led by Yaguo Wang from the University of Texas elucidates the role of defects in samples grown by chemical vapor deposition. Femtosecond pump probe spectroscopy reveals that such defects are prone to capture (within few picoseconds) and then release (at slightly longer timescales of hundreds of picoseconds) electrons and holes. Such dynamics are intrinsic to samples grown with this particular method and possibly linked to the oxygen-associated impurities introduced during growth. This knowledge is relevant to engineering the properties of 2D materials for optoelectronics applications.https://doi.org/10.1038/s41699-017-0019-1
spellingShingle Ke Chen
Rudresh Ghosh
Xianghai Meng
Anupam Roy
Joon-Seok Kim
Feng He
Sarah C. Mason
Xiaochuan Xu
Jung-Fu Lin
Deji Akinwande
Sanjay K. Banerjee
Yaguo Wang
Experimental evidence of exciton capture by mid-gap defects in CVD grown monolayer MoSe2
npj 2D Materials and Applications
title Experimental evidence of exciton capture by mid-gap defects in CVD grown monolayer MoSe2
title_full Experimental evidence of exciton capture by mid-gap defects in CVD grown monolayer MoSe2
title_fullStr Experimental evidence of exciton capture by mid-gap defects in CVD grown monolayer MoSe2
title_full_unstemmed Experimental evidence of exciton capture by mid-gap defects in CVD grown monolayer MoSe2
title_short Experimental evidence of exciton capture by mid-gap defects in CVD grown monolayer MoSe2
title_sort experimental evidence of exciton capture by mid gap defects in cvd grown monolayer mose2
url https://doi.org/10.1038/s41699-017-0019-1
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