Reliability and Failure Modes of Solid-State Lighting Electrical Drivers Subjected to Accelerated Aging

An investigation of an off-the-shelf solid-state lighting device with the primary focus on the accompanied light-emitting diode (LED) electrical driver (ED) has been conducted. A set of 10 EDs were exposed to temperature humidity life testing of 85% RH and 85 °C (85/85) without an electri...

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Bibliographic Details
Main Authors: Pradeep Lall, Peter Sakalaukus, Lynn Davis
Format: Article
Language:English
Published: IEEE 2015-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/7045442/