Reliability and Failure Modes of Solid-State Lighting Electrical Drivers Subjected to Accelerated Aging
An investigation of an off-the-shelf solid-state lighting device with the primary focus on the accompanied light-emitting diode (LED) electrical driver (ED) has been conducted. A set of 10 EDs were exposed to temperature humidity life testing of 85% RH and 85 °C (85/85) without an electri...
Main Authors: | Pradeep Lall, Peter Sakalaukus, Lynn Davis |
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Format: | Article |
Language: | English |
Published: |
IEEE
2015-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/7045442/ |
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