Simulation of sub-nm carrier profiling by scanning frequency comb microscopy
A mode-locked laser focused on the tunneling junction of a scanning tunneling microscope (STM) superimposes a microwave frequency comb with hundreds of harmonics on the DC tunneling current. Each harmonic, at an integer multiple of the laser pulse repetition frequency, sets the present state-of-the-...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2019-05-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.5092282 |