Deep Q-Learning with Bit-Swapping-Based Linear Feedback Shift Register fostered Built-In Self-Test and Built-In Self-Repair for SRAM
Including redundancy is popular and widely used in a fault-tolerant method for memories. Effective fault-tolerant methods are a demand of today’s large-size memories. Recently, system-on-chips (SOCs) have been developed in nanotechnology, with most of the chip area occupied by memories. Generally, m...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2022-06-01
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| Series: | Micromachines |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2072-666X/13/6/971 |