Unraveling False Positives in Unsupervised Defect Detection Models: A Study on Anomaly-Free Training Datasets

Unsupervised defect detection methods have garnered substantial attention in industrial defect detection owing to their capacity to circumvent complex fault sample collection. However, these models grapple with establishing a robust boundary between normal and abnormal conditions in intricate scenar...

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Bibliographic Details
Main Authors: Ji Qiu, Hongmei Shi, Yuhen Hu, Zujun Yu
Format: Article
Language:English
Published: MDPI AG 2023-11-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/23/23/9360