All About the Interface: Do Residual Contaminants at A High‐Quality h‐BN Monolayer Perylene Diimide Interface Cause Charge Trapping?

All About the Interface: Do Residual Contaminants at A High‐Quality h‐BN Monolayer Perylene Diimide Interface Cause Charge Trapping?

Abstract Intrinsic charge transport in molecularly thin organic semiconducting crystals is critically sensitive to the quality of the interfaces required to perform the electrical measurements. Most prominent are the dielectric–semiconductor and semiconductor–metal interface. While impacts from the...

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Bibliographic Details
Main Authors: Lukas Renn, Lisa S. Walter, Kenji Watanabe, Takashi Taniguchi, R. Thomas Weitz
Format: Article
Language:English
Published: Wiley-VCH 2022-04-01
Series:Advanced Materials Interfaces
Subjects:
charge transport
field‐effect transistor
interface
organic semiconductor
van‐der‐Waals
Online Access:https://doi.org/10.1002/admi.202101701

Internet

https://doi.org/10.1002/admi.202101701

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