Expected affine: A registration method for damaged section in serial sections electron microscopy
Registration is essential for the volume reconstruction of biological tissues using serial section electron microscope (ssEM) images. However, due to environmental disturbance in section preparation, damage in long serial sections is inevitable. It is difficult to register the damaged sections with...
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Frontiers Media S.A.
2022-09-01
|
| Series: | Frontiers in Neuroinformatics |
| Subjects: | |
| Online Access: | https://www.frontiersin.org/articles/10.3389/fninf.2022.944050/full |